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产品名称:

TFP-01,Test Finger Probe (IEC试验指)


产品型号: IEC试验指
产品展商: 珠海科尔迈测试设备有限公司
PDF文档下载:
 ED&D TFP-01 Test Finger Probe Brochure

简单介绍
TFP-01,Test Finger Probe (IEC试验指),符合: IEC, EN,CSA,UL标准.(品牌:美国.ED&D) ULP-02,Articulated Probe with Discs(关节试验指),符合UL标准.(品牌:美国.ED&D) ULP-02,Articulated Probe with Discs(UL关节试验指)


TFP-01,Test Finger Probe (IEC试验指)的详细介绍

TFP-01,Test Finger Probe (IEC试验指),符合: IEC, EN,CSA,UL标准.(品牌:美国.ED&D) ULP-02,Articulated Probe with Discs(关节试验指),符合UL标准.(品牌:美国.ED&D) ULP-02,Articulated Probe with Discs(UL关节试验指)


Model TFP-01: Test Finger Probe(IEC试验指)

This is the “International” test finger required by most IEC, EN and CSA Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements - with integral palm simulator. This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing - as mandated by the IEC CB Scheme. Finger made of chrome plated steel. All parts precision machined.

美国.ED&D产品服务于:IBM ，美国航空暨太空总署，英代尔，苹果， NCR ，索尼公司，太阳，飞利浦公司，思科， AT&T ， Compaq ， JVC ， Hewlett-Packard ，摩托罗拉， Mattel ，戴尔,3 Com 等公司;专为UL ， CSA ， ETL ， TUV,Demko等试验室提供检测产品.



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TFP-01,Test Finger Probe (IEC试验指)

]资料   PDF文档下载:
 ED&D TFP-01 Test Finger Probe Brochure


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At ED&D, we pride ourselves in the companies we serve….IBM, NASA, Intel, Apple, NCR, Sony, Sun, Philips, Cisco, AT&T, Compaq, JVC, Hewlett-Packard, Motorola, Mattel, Dell, 3Com you name it! And if that's not good enough, how about every major test lab in the world: UL, CSA, ETL, TUV, MET, Demko, etc.
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