TFP-01,Test Finger Probe (IEC试验指) IEC试验指

This is the “International” test finger required by most IEC, EN and CSA Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements - with integral palm simulator. This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing - as mandated by the IEC CB Scheme. Finger made of chrome plated steel. All parts precision machined.

美国.ED&D产品服务于:IBM ，美国航空暨太空总署，英代尔，苹果， NCR ，索尼公司，太阳，飞利浦公司，思科， AT&T ， Compaq ， JVC ， Hewlett-Packard ，摩托罗拉， Mattel ，戴尔,3 Com 等公司;专为UL ， CSA ， ETL ， TUV,Demko等试验室提供检测产品.

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TFP-01,Test Finger Probe (IEC试验指) 的相关产品

TPP-01,Short Test Pin Probe 试验短销
PCP-01,3.0mm Preset Controls Probe PCP-01,试验探棒
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CP-01, Coin Probe(硬币探针) 硬币探针
TPP-02,Long Test Pin Probe 试验长销
ULP-02,Articulated Probe with Discs(UL关节试验指) 关节试验指
UFP-01,Rigid Finger Probe 试验直指
FNP-01,Finger Nail Probe(试验指甲) 试验指甲
TUP-01, Uninsulated Live Parts Probe(试验探棒) 试验探棒
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TFP-01,Test Finger Probe (IEC试验指) IEC试验指
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HMP- 01, Hazardous Moving Parts Probe(试验探棒) 试验探棒
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TPK-01,Test Probe Kits(试验指针销套装) 试验指针销
BEP-01,Blunt-end Probe(试验探棒) 试验探棒
TRP-01,2.5mm Test Rod 试验探棒
HLP-01,4.0mm Hazardous Live Parts Probe 试验探棒
RTR-01,Rigidity Test Rod Probe(试验探棒) 试验探棒
ULP-01,UL Finger Probe(UL试验指) UL试验指
TSP-01,Test Sphere Probe(试验球) 试验球

At ED&D, we pride ourselves in the companies we serve….IBM, NASA, Intel, Apple, NCR, Sony, Sun, Philips, Cisco, AT&T, Compaq, JVC, Hewlett-Packard, Motorola, Mattel, Dell, 3Com you name it! And if that's not good enough, how about every major test lab in the world: UL, CSA, ETL, TUV, MET, Demko, etc.

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TFP-01,Test Finger Probe (IEC试验指)

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TFP-01,Test Finger Probe (IEC试验指)

TFP-01,Test Finger Probe (IEC试验指)