产品资料

EWP-01, Enameled Wire Probe(试验探棒)

EWP-01, Enameled Wire Probe(试验探棒).符合UL标准.品牌:美国.ED&D HMP- 01, Hazardous Moving Parts Probe(试验探棒),符合UL标准.品牌:美国.ED&D HMP- 01, Hazardous Moving Parts Probe(试验探棒)

EWP-01, Enameled Wire Probe(试验探棒).符合UL标准.品牌:美国.ED&D HMP- 01, Hazardous Moving Parts Probe(试验探棒),符合UL标准.品牌:美国.ED&D HMP- 01, Hazardous Moving Parts Probe(试验探棒)


ACCESSIBILITY PROBES 试验探针
FOR TESTING THE PROTECTION AGAINST ACCESS TO HAZARDOUS PARTS

EWP-01, Enameled Wire Probe(试验探棒)

 

 

For testing accessibility in accordance with many UL Standards. In many Standards, this probe is used for access to enamel coated wire (i.e. transformers and inductors). The handle is Delrin and the tip is stainless steel.

美国.ED&D产品服务于:IBM ,美国航空暨太空总署,英代尔,苹果, NCR ,索尼公司,太阳,飞利浦公司,思科, AT&T , Compaq , JVC , Hewlett-Packard ,摩托罗拉, Mattel ,戴尔,3 Com 等公司;专为UL , CSA , ETL , TUV,Demko等试验室提供检测产品.

无相关文档
EWP-01, Enameled Wire Probe(试验探棒) 试验探棒 其它品牌