TH-01, Test Hook Probe(试验钩)
TH-01, Test Hook Probe(试验钩).品牌:美国.ED&D
| ACCESSIBILITY PROBES 试验探针 |
| FOR TESTING THE PROTECTION AGAINST ACCESS TO HAZARDOUS PARTS |
TH-01, Test Hook Probe(试验钩)
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Used on enclosures prior to accessibility testing. The test hook is “hooked” into vents and seams in the enclosure & then pulled with a force (usually 20N). The hook has a hole at its long end, for use in conjunction with a PFI series Force Gauge. Made entirely of stainless steel. |
美国.ED&D产品服务于:IBM ，美国航空暨太空总署，英代尔，苹果， NCR ，索尼公司，太阳，飞利浦公司，思科， AT&T ， Compaq ， JVC ， Hewlett-Packard ，摩托罗拉， Mattel ，戴尔,3 Com 等公司;专为UL ， CSA ， ETL ， TUV,Demko等试验室提供检测产品.
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TH-01, Test Hook Probe(试验钩)
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