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SP-01,Scratch Pin Probe 乱写探针

SP-01,Scratch Pin Probe 乱写探针,基于IEC标准,适用表面绝缘层的磨擦试验,品牌:美国.ED&D

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SP-01,Scratch Pin Probe 乱写探针
Used to test resistance to abrasion on insulating materials and conformal coatings. Hardened steel pin, the end is a cone having a top angle of 40 degrees, tip is rounded with a radius of 0.25 ± 0.02 mm. Complies with many Standards, including IEC based Standards. Entire scratch test apparatus available.

美国.ED&D产品服务于:IBM ,美国航空暨太空总署,英代尔,苹果, NCR ,索尼公司,太阳,飞利浦公司,思科, AT&T , Compaq , JVC , Hewlett-Packard ,摩托罗拉, Mattel ,戴尔,3 Com 等公司;专为UL , CSA , ETL , TUV,Demko等试验室提供检测产品.

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